Field calibration of a structured light range-sensor

ABSTRACT

The technology described herein recalibrates a structured light sensor in the field using time-of-flight sensor data. Structured light sensors are sensitive to mechanical changes that result in decreased accuracy. A structured light system calculates the range to an object by comparing a reference image to the actual image of the scene. The reference image is what the projected light pattern would look like on a flat object at a known distance. When the projected image changes, the reference image no longer matches the projected pattern. The calibration technology described herein captures a new reference image based on the current sensor characteristics using a time-of-flight capable sensor as the structured light imaging sensor.

CROSS-REFERENCE TO RELATED DOCUMENTS

This application is a continuation of U.S. patent application Ser. No.15/971,765, filed on May 4, 2018, titled “Field Calibration of AStructured Light Range-Sensor” the entirety of which is herebyincorporated by reference.

BACKGROUND

One of the features of machine vision systems can be the ability torecognize a scene and identify features and objects in the scene.Machine vision systems can be used in portable devices, such ashead-mounted devices, on industrial robots, driverless cars, and otherdevices. Over time, the performance of such systems can degrade. Thedegradation can be difficult to detect so long as the vision system isstill generating a depth image. For example, it is difficult todetermine whether the assigned depths are accurate.

Different types of depth camera technology exist. Time-of-flight (TOF)can be used to produce range images at any distance, but suffers fromerrors due to multipath and other factors. Activetriangulation/structured illumination is less prone to multipath but ismore sensitive to mechanical changes and misalignment caused bytemperature changes, physical mistreatment, and such.

Standard structured light sensors are calibrated once at the factoryunder carefully controlled conditions when developed. The structuredlight sensors can suffer performance problems if either the pattern oroptics change over time (e.g., due to physical shock) and need to berecalibrated in order to accurately measure distance.

SUMMARY

This Summary is provided to introduce a selection of concepts in asimplified form that are further described below in the DetailedDescription. This Summary is not intended to identify key features oressential features of the claimed subject matter, nor is it intended tobe used as an aid in determining the scope of the claimed subjectmatter.

The technology described herein recalibrates a structured light sensorin the field using time-of-flight sensor data. Structured light sensorsare sensitive to mechanical changes and misalignment caused bytemperature and physical mistreatment in the field. These changes resultin decreased accuracy. The in-field recalibration is completed withoutuse of a complex calibration rig. Currently, structured light sensorsare calibrated at the factory by a skilled technician or automatedsystem using a complex calibration rig that locates the structured lightsensor in a precise location relative to a target surface under highlycontrolled conditions. The calibration apparatus is not practical for aconsumer to use or own because it is relatively large and expensive.

A structured light sensor comprises a light emitter and a camera. Thelight emitter illuminates a scene with structured light. The cameracaptures the structured light as it is reflected off the scene. For moststatic-pattern structured light sensors, the aim of the calibrationprocess is to produce a reference image. The reference image typicallyis what the projected light pattern would look like on a flat object ata known distance, albeit other equivalent representations are possible.The range to an object is calculated by comparing the reference image tothe actual image of the scene. This is possible because the projectedpattern, as imaged by the sensor, is translated vs. the reference imageas a function of z-distance to the object along an axis parallel to thebaseline between the sensor and the light emitter. In some systems, thereference image is not explicitly stored, instead a model equivalent toor summarizing an explicit reference image is used. For example, if thereference image is composed of dots, then the reference image couldpotentially be summarized by a list of dot locations in the image. Thisis an example of a model of the reference image. In this patent, wherewe refer to a reference image, we include the possibility of a model ofthe reference image unless excluded—an implicit reference image, ratherthan an explicit reference image.

As the sensor optics change in response to environmental conditions,mechanical trauma, and such, the projected image can change. When theprojected image changes, the reference image no longer matches theprojected pattern. The calibration technology described herein capturesa new reference image based on the current sensor characteristics.

By using a time-of-flight capable sensor as the structured light imagingsensor, a fixed mechanical setup is no longer required. Instead, thecamera can be aimed at a wall, group of objects, or other calibrationscene and a calibration performed, because the time-of-flight data canbe used to calculate a range for the target object/scene.

BRIEF DESCRIPTION OF THE DRAWINGS

The technology described herein is illustrated by way of example and notlimitation in the accompanying figures in which like reference numeralsindicate similar elements and in which:

FIG. 1 is a block diagram of an example structured light system, inaccordance with an aspect of the technology described herein;

FIG. 2 is a block diagram of an example structured light system, inaccordance with an aspect of the technology described herein;

FIG. 3 is a block diagram of an example structured light system, inaccordance with an aspect of the technology described herein;

FIG. 4 is a diagram depicting structured illumination reflected off aflat surface, in accordance with an aspect of the technology describedherein;

FIGS. 5A and 5B illustrate geometric correction of dots, in accordancewith an aspect of the technology described herein;

FIG. 6 is a diagram depicting a TOF depth adjusted structured lightimage, in accordance with an aspect of the technology described herein;

FIG. 7 is a diagram depicting a field calibration environment, inaccordance with an aspect of the technology described herein;

FIG. 8 is a diagram depicting a calibration image captured by a sensorviewing the field calibration environment, in accordance with an aspectof the technology described herein;

FIG. 9 is a diagram depicting an adjusted calibration image, inaccordance with an aspect of the technology described herein;

FIGS. 10-12 are flow diagrams showing methods of calibrating astructured light range sensor, in accordance with an aspect of thetechnology described herein; and

FIG. 13 is a block diagram of an exemplary computing environmentsuitable for use in implementing aspects of the technology describedherein.

DETAILED DESCRIPTION

The various technology described herein are set forth with sufficientspecificity to meet statutory requirements. However, the descriptionitself is not intended to limit the scope of this patent. Rather, theinventors have contemplated that the claimed subject matter might alsobe embodied in other ways, to include different steps or combinations ofsteps similar to the ones described in this document, in conjunctionwith other present or future technologies. Moreover, although the terms“step” and/or “block” may be used herein to connote different elementsof methods employed, the terms should not be interpreted as implying anyparticular order among or between various steps herein disclosed unlessand except when the order of individual steps is explicitly described.In some cases an explicit discussion of lens geometric distortioncorrection has been omitted, as various known methods can be applied.

The technology described herein recalibrates a structured light sensorin the field using time-of-flight sensor data. Structured light sensorsare sensitive to mechanical changes and misalignment caused bytemperature and physical mistreatment in the field. These changes resultin decreased accuracy. The in-field recalibration is completed withoutuse of a complex calibration rig. Currently, structured light sensorsare calibrated at the factory by a skilled technician or automatedsystem using a complex calibration rig that locates the structured lightsensor in a precise location relative to a target surface under highlycontrolled conditions. The calibration apparatus is not practical for aconsumer to use or own because it is relatively large and expensive.

A structured light sensor comprises a light emitter and a camera. Thelight emitter illuminates a scene with structured light. The cameracaptures the structured light as it is reflected off the scene. For moststatic-pattern structured light sensors, the aim of the calibrationprocess is to produce a reference image. The reference image can be whatthe projected light pattern would look like on a flat object at a knowndistance, however, other equivalent representations are possible. Therange to an object is calculated by comparing the reference image to theactual image of the scene. This is possible because the projectedpattern, as imaged by the sensor, is translated vs. the reference imageas a function of z-distance to the object along an axis parallel to thebaseline between the sensor and the light emitter. In some systems, thereference image is not explicitly stored, instead a model equivalent toor summarizing an explicit reference image is used. For example, if thereference image is composed of dots, then the reference image couldpotentially be summarized by a list of dot locations in the image. Thisis an example of a model of the reference image. In this patent, wherewe refer to a reference image, we include the possibility of a model ofthe reference image unless excluded—an implicit reference image, ratherthan an explicit reference image.

As the sensor optics change in response to environmental conditions,mechanical trauma, and such, the projected image can change. When theprojected image changes, the reference image no longer matches theprojected pattern. The calibration technology described herein capturesa new reference image based on the current sensor characteristics.

By using a time-of-flight capable sensor as the structured light imagingsensor, a fixed mechanical setup is no longer required. Instead, thecamera can be aimed at a wall, group of objects, or other calibrationscene and a calibration performed, because the time-of-flight data canbe used to calculate a range for the target object/scene.

A structured light image is the reflection of a structured light patternoff objects in the scene. The depth map can be determined by capturingthe structured light image and then using a triangulation method todetermine a depth profile (i.e., depth map) based on the observedrelative translation of known features of the structured illumination inthe captured structured light image as scaled by the estimated baselinefrom the illuminator (light emitter) to the sensor.

In this discussion, a structured light image corresponds to an imagederived in part from use of a structured light source. A structuredlight source corresponds to a light source or illumination source thatprojects a plurality of units (e.g., dots) arranged to form a pattern orstructure. In some implementations, the light source for projecting astructured light image can be an infrared light source and/or anotherlight source with reduced or minimized detectability in the visiblespectrum. This can allow the structured light image to be projected ontoan environment while having a reduced or minimized impact on imagesobtained using conventional visible light cameras (and/or other visiblelight detectors). The structured light image can then be captured usinga corresponding camera (and/or other detector) suitable for detection ofthe type of light projected by the structured light source.

The units of the structured light image can correspond to any convenienttype of reference pattern, so long as the reference pattern at any pointin time is known at the time of calibration (such as predetermined). Adepth map can be determined based on a structured light image by, forexample, triangulation. One option for triangulation can be to have aknown distance relationship between the structured light source and asingle camera for capturing the structured light image. In this type ofoption, the known offset between the structured light source and thecamera can be used in combination with a predetermined reference imageprojected by the structured light source to allow the light source to beused as a “virtual camera” for purposes of triangulation.

In various aspects, the number of units projected by a structured lightsource can be substantially smaller than the number of pixels used torepresent an environment. As a result, the number of pixels illuminatedby a dot from a structured light source can be substantially less thanthe total number of pixels. This can be in contrast to the light imagesprojected by time-of-flight systems, where the projected illuminationcan correspond to continuous illumination or a “flood fill” thatilluminates all or substantially all of the pixels in a view. Forexample, for a structured light image based on illumination from astructured light source, the number of pixels that are (at leastpartially) illuminated by a dot or unit can be 60% or less of the totalnumber of pixels in the field of view corresponding to an environment.Expressed as a ratio, the number of pixels illuminated by a dot versuspixels not illuminated by a dot can be 1.5 or less (i.e., 60% or less oftotal pixels). More generally, the dots projected by a structured lightsource can correspond to having a ratio of illuminated pixels tonon-illuminated pixels, in a reference direction suitable for definingthe nature of a structured light image of the structured light source,of about 1.0 or less, or about 0.5 or less, or about 0.3 or less, orabout 0.2 or less. In this discussion, pixels that are illuminated by adot can be referred to as pixels that cover a dot and/or that areassociated with a dot. It is further noted that the dots projected inthe structured light image may have overlap with more than one pixel.

In aspects, the technology described herein outputs both a structuredlight and modulated light through a single light emitter. In this way,the modulated light does not flood the field, but instead follows aratio consistent with a structured light system and each pixel may notreceive modulated light.

The time-of-flight camera may be a phase modulation time-of-flightcamera. It comprises a light emitter and an image sensor. The lightemitter outputs modulated light. In an example, the source of modulatedlight may be an incoherent light source, which emits transmitted lightthat is modulated with a signal at a modulation frequency. In anexample, the light from the device may be modulated rapidly, such thatthe amount of illumination changes periodically.

In a phase modulation system, the light emitter can output light atmultiple modulation frequencies. The light emitter may be selected sothat the wavelength of the emitted light is the most appropriatewavelength for a particular application. In an aspect, the light sourcemay be selected to be a source of light of an appropriate wavelength forthe application for which it is intended.

The light source may illuminate an object within the field of the cameraand at least some of the light is reflected back toward the camera fromthe object. The reflected light may be detected by the image sensor. Thereflected light is also modulated and the reflected light may be out ofphase with the transmitted light due to the delay caused by the distancethe light has travelled on the return trip between the sensor and theobject. For each pixel of the image sensor, the amplitude and phasedifference of the received signal relative to the transmitted light maybe determined for each modulation frequency and used to calculate adepth for the pixel.

The calibration technology described herein will be described withreference to a static-pattern structured light sensor, however, thecalibration can be used for other types of structured light sensors.

As used herein, a depth image may comprise a number of pixels with adepth value for each pixel. The depth value for each pixel correspondswith a distance between a point on an object in the scene being viewedby the depth camera and a reference position. In some cases, a depthvalue may not be returned for every pixel, because the illuminationpattern does not emit light in that region of the scene or the scene islow reflectivity for the particular imaging wavelength used.

The following discussion will first describe the nature of therange-imaging system that is to be calibrated. The novel in-fieldcalibration method is then described. There are two approaches tostructured light range-imaging that can be calibrated using thetechnology described herein: one uses a completely arbitrary pattern andcompares against a reference image, there other is a pattern composed ofa plurality of units where the algorithm stores a reference model,comprising a list of unit locations in a reference image.

Arbitrary Pattern Approach

Any structured light algorithm that involves comparison of the capturedimage of a scene to a reference image may be used. One implementationtakes the input image, performs contrast and dynamic range enhancement,corrects for geometric distortion by resampling the image and thenapplies a block matching algorithm to determine the disparity betweenthe processed image and the reference image. This is typically performedby explicitly or implicitly testing how well regions of the processedimage match the reference image by translating them in the directionparallel to the baseline between the illumination and the sensor andcalculating a cost function, such as sum-squared-error. Otherprocessing/cost functions may be included to speed up this process,perform only a partial search or to fill in missing data/ensure spatialcontiguity. Once the best match/lowest cost function value has beendetermined, the disparity between the processed image and the referenceimage is known and Z-distance can be calculated as a function of thedisparity by Z=c/DISPARITY. Where c is a constant that is typically afunction of the baseline distance between the illumination and theimaging sensor and the focal length of the lens.

Unit Detection Approach

This approach relies on detecting units present in the illuminationpattern and then tracking the units vs. a reference model, rather thanblock matching against a reference image. While there are many potentialimplementations, one particular implementation is given below.

Units in the captured image may be detected by any method known to thoseskilled in the art. For example, for units that are dots, a localcontrast enhancement, thresholding and centroiding process may beapplied in order to determine dot locations. Other techniques may useLaplacian of Gaussian filters, matched filters, deep neural networks,standard blob detection algorithms, machine learning or any othermathematical transformation capable of identifying the location of aunit. The location of each unit is determined and a correction isapplied based upon the TOF so as to remove any translation/disparityintroduced due to the baseline between the illuminator and the sensor.In addition to this, at any stage a correction may be applied forgeometric distortion, either by resampling the original image or byperforming a mathematical transformation of the estimated unit locationin order to correct for the distortions introduced by thecharacteristics of the imaging lens/lenses. This process can be repeatedfor each dot or unit detected, until each unit is repositioned to formthe TOF-adjusted structured light model. At this point, the correctedunit locations should match or closely approximate those in thereference model. The TOF-adjusted structured light model can then beused to identify each detected unit uniquely or near-uniquely. TheTOF-adjusted structured light model can be a resampled image, a list ofadjusted coordinates for units detected in the captured image or anyother equivalent representation that encodes the image in atriangulation disparity corrected form. The adjusted coordinates can beused to identify units in the captured image uniquely or near-uniquely.The actual image or non-TOF-adjusted coordinates are used to calculatethe structured light z-depth by calculating the disparity introducedalong the axis of the sensor-illumination baseline. The TOF-adjustedstructured light model is only used to identify detected units within animage. In one implementation of the technology described herein, eachdot is uniquely identified without reference to any neighboring dots inthe image by finding the best matching dot in a list of dots or in areference image in the TOF-adjusted representation. In anotherimplementation, the neighboring dots in either the reference image orthe real image are used to assist in identification using their relativelocations in the structured light image, the TOF structured light image,or any other parameters calculable from the available data, such asrelative intensity of the dots. In one particular variant, the N-nearestmatches in the reference image are found and a search is performed byfinding the match for each pixel, which minimizes the Lp norm of thedifference in Z between the dot and its M-nearest neighbors in theoriginal image. Additional thresholds on the relationship between theTOF data and the estimated range from triangulation or other parametersmay be applied at any stage. For example, in one implementation, onlydots which correspond to range-from-triangulation values that are verynear to the TOF deduced range value or closer than the TOF deduced rangevalue are considered to be valid matches, thus reducing the search spaceand computational complexity. Implementations may use a wide variety ofdata structures in order to enable fast identification of specificcorresponding dots in the reference image, such as quad-trees ordecision trees. In some implementations, machine-learning techniques,such as neural networks may be used to accelerate dot identification foreither a dot in isolation or over a group of neighboring dots.

Once the identity of each dot has been determined, the structured lightz-depth can be calculated. In one implementation of the technologydescribed herein, the structured light z-depth is calculated byZ_STRUCTURE=c/(X_DOT−X_REF), where X_REF is the x-location of the TOFcorrected reference at infinity (the dot that X_ADJUSTED value enablesus to determine) and Z_STRUCTURE is the determined structured lightz-depth.

In some implementations, the structure z-depth data is furtherdenoised/enhanced using the range measurements from TOF. Denoising canimprove the image quality subjectively or objectively. Thedenoise/enhance process may take the form of dynamically determinedweights for the purposes of averaging, based upon the difference inz-distance or radial distance between adjacent dots or any otherapproach that uses features/data from TOF to improve the subjective orobjective quality of the structure z-depth image. A specific example isa bilateral filter, where the weights are based upon TOF range data butapplied to the z-data generated from structure. A similar filter couldbe implemented for a sparse image by performing a weighted average ofthe N-nearest detected dots, either in 3D space or in image space. Someof these filters may also be applied solely using the structure z-depth,without further use of TOF data.

Calibration Process

The calibration process for both types of structured light sensor isquite similar. Initially, the user aims the range-imaging system at ascene and moves the camera around, so that each pixel in the cameraintegrates light from a plurality of ranges. As the camera is movedaround the scene, the camera simultaneously or near simultaneouslycaptures a stream of images that contain both range data and thestructured illumination pattern. In the simplest implementation, thereference model or reference image is estimated by performing geometricdistortion correction, then reversing the triangulation induceddisparity using TOF depth, then combining these estimates from differentcamera locations so as to reduce noise and ensure that there are nomissing regions of the reference image/model. Depending on the rangesand reflectivities in the scene imaged by the camera, a single image isnot enough to reconstruct the full reference image/model, as not all ofthe projected pattern may be imaged by the imaging sensor due toocclusion in the scene, and there may be significant noise present in asingle image. The estimates of the reference image model from thedifferent images of the scene are combined in order to generate a finalreference image.

A number of systematic errors may be corrected for in the case ofreference image estimation, including the 1/range{circumflex over ( )}2drop off in the intensity of the active illumination due to thefundamental physical properties of the propagation of light. This meansthat even if the brightness of the pattern is consistent across thefield-of-illumination on a constant reflectivity flat surface at adistance of 1 meter, if part of the scene is at 2 meters from the cameraand another part is at 1 meter, then given homogenous scene intensitythe part of the scene at 2 meters will be one quarter the brightness ofthe part of the scene at 1 meter. In some implementations thiscorrection may be achieved by converting intensity into a commondistance representation, by multiplying pixels or regions of the imageintensity by a value proportional to range{circumflex over ( )}2. Insome implementations, correction for the relative illumination of thesensor, or known or inferred reflectivity may also be applied. In oneimplementation, the camera calibration is performed by generating aseries of these systematic error corrected images and then calculatingthe mean on a per-pixel basis. In other implementations the median, aweighted average or any other mathematical method of combining thesystematic error corrected images on a per-pixel basis may be used.

In one implementation the raw input image is resampled to correct fortriangulation induced disparity, then a local contrast enhancement isperformed in order to correct for drop-off in the intensity of theactive illumination with range, unknown reflectivity, relativeillumination and other factors. Any algorithms capable of achieving astandard contrast across the image may be applied, one implementation isto convolve the triangulation corrected image with an 11×11 box filter.The triangulation corrected image is divided by the convolved image inorder to produce an image with consistent contrast. This is just oneexample, and other implementations are possible. In one implementation,the camera calibration is performed by generating a series of thesecontrast corrected images and then calculating the mean on a per-pixelbasis. In other implementations the median, a weighted average or anyother mathematical method of combining the contrast corrected images ona per-pixel basis may be used.

In some implementations a reference image generated by the aboveprocesses may be further processed to generate a reference model.

Specialized Reference Model Implementation

One implementation of the invention in the case of a reference model ofunits present in the projection pattern tracks the unit centroid orlocation as the camera is moved within the scene and combines it withTOF data in order to estimate the location the unit would be in at anarbitrary distance, for example infinity.

Units may be detected by various methods. For example, for units thatare dots, a local contrast enhancement, thresholding and centroidingprocess may be applied in order to determine dot locations. Othertechniques may use Laplacian of Gaussian filters, matched filters, deepneural networks, standard blob detection algorithms from the literature,machine learning or any other mathematical transformation capable ofidentifying the location of a unit.

As the camera is moved around the scene, the camera simultaneouslycaptures a stream of images that contain both range data and thestructured illumination pattern. The camera is moved sufficiently slowlyand the frame rate is sufficiently high that the units are trackedacross frames by comparing the detected locations in adjacent frames,for example using a least squares metric. As each individual dot istracked over time, it traces out a curved path that encodes informationabout the geometric distortion properties of the lens. If the trackingis carried out after geometric distortion correction has been applied tothe image or the dot location itself, then the dot traces out a line inthe direction of the baseline between the imaging sensor and theilluminator, due to the impact of triangulation. If the dot location iscorrected for triangulation induced disparity, then the triangulationand geometric distortion corrected dot locations form a cluster. Theseclusters consist of noisy measurements of the unit location in thereference model and the reference model is calculated by combiningthese, in some implementations this is achieved via taking the mean, orthe median, or a weighted mean, or any other method of producing a valuerepresentative of the cluster location. This is explained in greaterdetail, with reference to figures, later in this document. Thisparticular reference model is one type of calibration achievable by thedisclosed method.

In some implementations the geometric distortion parameters of the lensare known, but the baseline is not known and therefore the functiondescribing how to correct for triangulation induced disparity isunknown. In this case, the tracked dots form lines. Using TOFinformation, adjusted dot locations can be calculated using the equation

X_ADJUSTED=X_DOT−c/Z_TOF

Where c is a constant that is typically a function of the baselinedistance between the illumination and the imaging sensor and the focallength of the lens, and X_DOT is the non-TOF-corrected X location of thedot, Z_TOF is the Z-distance calculated via TOF. The above equationassumes that the imaging sensor and the light emitter are located in aside-by-side arrangement next to each other along the x-axis, in whichcase Y_ADJUSTED=Y_DOT. If the camera and emitter are arranged along they-axis, then the disparity would be along the y-axis, it is alsopossible to have an arbitrary rotation in which there may be two valuesof c, one for X and one for Y etc. For any value of c, a cost functioncan be formed representing the spread of the cluster of dots locationsfor each dot, in some implementations this may be the sum of thevariance of X_ADJUSTED and Y_ADJUSTED over all the dot locations foreach dot e.g.

Cost=Σ_(d∈DOTS)(σ_(X) _(d,ADJUSTED) ²+σ_(Y) _(d,ADJUSTED) ²)

Where DOTS is the set of all dots, d is a specific dot, σ_(X)_(d,ADJUSTED) ² is the variance of the X_ADJUSTED values for dot d andσ_(Y) _(d,ADJUSTED) ² is the variance of the Y_ADJUSTED values for dotd. Any cost function may be used, including least squares, mean absoluteerror/variation and other mathematical functions, so long as the costfunction is designed to cluster the adjusted dot locations as closely aspossible. Any algorithm can then be applied to the cost function thatminimizes the cost function. For example, Newtons Method is a standardoptimization approach, but we include any algorithm known to thoseskilled in the art, including Nelder-Mead. Maximizing a cost functionwhere large values correspond to greater clustering is also anotherimplementation. Any subset of dots or dot position information may beused.

An additional implementation is to form the cost function in such a waythat there is a direct inverse, without a numerical optimizationoperation. One implementation for the case of a baseline perfectlyoriented along the x-axis is

$c = \frac{\Sigma_{d \in {DOTS}}\left( {{nx_{d}^{T}v_{d}} + {x_{d}^{T}J_{n}v_{d}}} \right)}{\Sigma_{d \in {DOTS}}\left( {{nv_{d}^{T}v_{d}} + {v_{d}^{T}J_{n}v_{d}}} \right)}$

Where n is the number of positions for each dot, x_(d) is a verticalvector of the non-TOF-corrected dot locations for dot d, v_(d) is avertical vector of the reciprocals of the TOF estimated Z-distance foreach of the positions for dot d or a mathematically equivalent/similarvalue, and J_(n) is an n×n matrix of ones.

In one implementation, once c is known, TOF corrected dot clusterlocations are used as a reference model in combination with c by astructured light range imager in order to determine range.

In some implementations, the geometric distortion parameters may beunknown and determined by the calibration method. This may be in thecase where the baseline is either know or unknown. In theseimplementations the geometric distortion parameters are estimated byminimizing the size of the cluster of transformed dot positions for eachdot in a similar manner to the above approach for baselinedetermination, but with an additional transformation and parameters tobe optimized for. In one implementation, where the baseline has anarbitrary orientation, the X_ADJUSTED and Y_ADJUSTED values arecalculated by

X_ADJUSTED=f_x(X_RAW,Y_RAW,GEOMETRIC_PARAMETERS)−c_x/Z_TOF

Y_ADJUSTED=f_y(X_RAW,Y_RAW,GEOMETRIC_PARAMETERS)−c_y/Z_TOF

Where f_x(X_RAW, Y_RAW, GEOMETRIC_PARAMETERS) is a function that takesthe raw X and Y location of a dot in the image (X_RAW, Y_RAW) and usesthe current estimate of the geometric parameters of the lens tocalculate an estimate of the X location as if the lens did not sufferfrom any geometric distortion and f_y(X_RAW, Y_RAW,GEOMETRIC_PARAMETERS) is a function that calculates an estimate of the Ylocation as if the lens did not suffer from any geometric distortion.

The functions f_x and f_y are implemented as computer code and maycorrespond to direct implementation of a mathematical formula, or a morecomplicated look-up table or the solution of an optimization problemthemselves, or any realizable implementation that produces estimates ofthe true undistorted x and y locations, including standard geometric orradial distortion models from the literature and arbitrary polynomial orrational functions. One implementation of f_x and f_y is

f_distort(r)=(1+kappa_1*r+kappa_2*r{circumflex over( )}2)/(1+kappa_3*r+kappa_4*r{circumflex over ( )}2+kappa_5*r{circumflexover ( )}3)

f_x(X_RAW,Y_RAW,GEOMETRIC_PARAMETERS)=X_C+(X_RAW−X_C)*f_distort(sqrt((X_RAW−X_C){circumflexover ( )}2+(Y_RAW−Y_C){circumflex over ( )}2))

f_y(X_RAW,Y_RAW,GEOMETRIC_PARAMETERS)=Y_C+(Y_RAW−Y_C)*f_distort(sqrt((X_RAW−X_C){circumflexover ( )}2+(Y_RAW−Y_C){circumflex over ( )}2))

Where f_distort(r) is an intermediate function that calculates theamount of radial distortion correction given the distance from thecenter of distortion, r, and a list of distortion parameters kappa_1,kappa_2, kappa_3, kappa_4, kappa_5. Sqrt( ) is a function that takes thesquare root of a value, {circumflex over ( )} indicates anexponentiation operation. X_C and Y_C are parameters that indicate thecentre of distortion in pixel coordinates. In this particularimplementation, GEOMETRIC_PARAMETERS is considered to be a tuplecomprised of X_C, Y_C, kappa_1, kappa_2, kappa_3, kappa_4 and kappa_5.

For any values of c_x, c_y and GEOMETRIC_PARAMETERS, a cost function canbe formed representing the spread of the cluster of transformed dotlocations, where the cost function measures the degree of concentrationin one location, any function or approximation with this property may beapplied, such as mean absolute distance from the mean, in someimplementations this may be the sum of the variance of X_ADJUSTED andY_ADJUSTED over all the dot locations for each dot e.g.

Cost=Σ_(d∈DOTS)(σ_(X) _(d,ADJUSTED) ²+σ_(Y) _(d,ADJUSTED) ²)

Where DOTS is the set of all dots, d is a specific dot, σ_(X)_(d,ADJUSTED) ² is the variance of the X_ADJUSTED values for dot d andσ_(Y) _(d,ADJUSTED) ² is the variance of the Y_ADJUSTED values for dotd. Any cost function may be used, including least squares, mean absoluteerror/variation and other mathematical functions, so long as the costfunction is designed to cluster the adjusted dot locations as closely aspossible.

Optimization is then performed over the cost function in order todetermine c_x, c_y and GEOMETRIC_PARAMETERS either simultaneously orsequentially, where kappa_1, kappa_2 etc. estimation may potentiallyalso be performed sequentially. This may use any suitable optimizationapproach known to those skilled in the art, including numerical methodssuch as Newton's Method, arbitrary regularization approaches and moreadvanced methods such as genetic algorithms. In some implementationsdirect equations may be used to calculate the geometric model parametersor c_x, c_y instead of explicit numerical optimization. In oneimplementation Nelder-Mead is used. The output of the optimization is areference model containing all the undistorted dot cluster centers withTOF z-distance correction, as well as lens geometric parameters andillumination-sensor baseline calibration, which are used as inputs to astructured illumination ranger, or similar system. Variants are possiblewhere some subset of the parameters are fixed or determined by othermethods and only a subset of the parameters are optimized over.

FIG. 1 schematically represents an example of a structured light system100 suitable for determining a depth map from a structured light image.The system shown in FIG. 1 includes a modulated structured light source110 for projecting a structured light image onto a scene or environmentwhere the projected light is also modulated. In an aspect, thestructured light system 100 can have only a single light source andsingle imaging system. Camera or image sensor 120 can be used to capturethe projected structured light image. The captured structured lightimage can then be processed by one or more components of FIG. 1 in orderto generate a depth map or a new reference image. The components shownin FIG. 1 can be implemented, for example, using a processing unit withassociated memory that executes computer-executable instructions. Moregenerally, the components shown in FIG. 1 can be implemented using anyconvenient combination of hardware, firmware, and/or software. Forconvenience, a plurality of separate components are shown in FIG. 1, butit is understood that these components can be combined and/or split inany convenient manner. The components can include a TOF-depth mapcalculation component 125, a structured-light depth-map calculationcomponent 130, a dot detection component 135, a dot identificationcomponent 140, and a calibration component 122.

Additionally, FIG. 1 shows an additional processing component 180 forperforming additional processing based on a depth map. Additionalprocessing component 180 can, for example, correspond to a texturemapping and rendering component. The output from such an additionalprocessing component 180 could be displayed to a user via a displaydevice 190. The display device could correspond to a conventionalstand-alone video display, an augmented reality headset (i.e., ahead-mounted display device), a display screen on a mobile computingdevice, a display screen associated with another computing device,and/or any other convenient display device.

The modulated structured light source 110 comprises a light emitter thatoutputs structured light that is also modulated light. In an example,the source of modulated light may be an incoherent light source, whichemits transmitted light that is modulated with a signal at a modulationfrequency. In an example, the light from the device may be modulatedrapidly, such that the amount of illumination changes periodically. In aphase modulation system, the light emitter can output light at multiplemodulation frequencies. The light emitter may be selected so that thewavelength of the emitted light is the most appropriate wavelength for aparticular application. In an aspect, the light source may be selectedto be a source of light of an appropriate wavelength for the applicationfor which it is intended. As explained, the modulated light is given astructural arrangement of units that can be organized in a repeatingpattern, such as in a grid, or randomized. In FIG. 1, the unit isdescribed as a dot, but other shapes may be used.

Image sensor 120 includes a physical light sensor that can be used tocapture the projected structured light image. The image sensor 120 caninclude software and hardware to generate a digital image of thecaptured light. The image sensor 120 includes a sensor that candetermine a frequency of the received light to be used in a TOF depthdetermination.

The image sensor 120 and light emitter 110 can take the form of thesystem shown in FIG. 3. FIG. 3 schematically represents a structuredlight source 310 and an imaging system 330 that can be used to capture astructured light image. In aspects, the structured light source 310 andimaging system 330 can be part of a single system. In the example of astructured light source shown in FIG. 3, structured light source 310includes a laser diode 312 (or optionally one or more laser diodes 312),such as a single mode laser diode, for generating modulated light. Inone aspect, the laser is a 2.4 W single mode, multi-emitter laser. Otheremitters may be used with the technology described herein, such as LEDs,VCSELs or single-mode, single emitter lasers. Light from laser diode 312can then pass through a collimating optic element 314 to provide(substantially) collimated light. The collimated light can then passthrough a diffractive optic element 316 to generate light correspondingto a structured light source pattern.

The light from structured light source 310 can be used to project thestructured light source pattern onto a view or scene to form astructured light image. The view or scene is schematically representedby surface 320. The structured light image can then be captured byimaging system 330. In the example shown in FIG. 3, imaging system 330can include an imaging lens 332, one or more filters 334 (such as an IRbandpass filter), and a sensor 336. In one aspect, the imaging sensorhas 512×424 usable pixels and is configured with ˜35×29 degree field ofview, with 8 mm focal length @ f/2.0. Aspects are not limited to thisimaging sensor.

Turning now to FIG. 4, a graphic representation 400 of a reflectedstructured light image is depicted. The graphic representation 400represents just a portion of a possible real-world structured lightimage. An actual structured light image might have many more rows andcolumns of dots than depicted. Aspects are not limited to a structuredlight image comprising dots or a grid pattern. Other types of graphicalunits can be arranged into any number of patterns, including bothorganized patterns and randomized.

The orderly arrangement of units within the reflected structured lightimage depicted could be generated by capturing structured lightreflected off a relatively flat surface because the reflection maintainsa similar arrangement as the projected light. As can be seen, the dotsare arranged in evenly spaced rows and columns that largely match theprojected structure. The first row of dots comprises dots 401, 402, 403,404, 405, 406, 407, and 408. The second row of dots comprises dots 411,412, 413, 414, 415, 416, 417, and 418. The third row of dots comprisesdots 421, 422, 423, 424, 425, 426, 427, and 428. The fourth row of dotscomprises dots 431, 432, 433, 434, 435, 436, 437, and 438. The fifth rowof dots comprises dots 441, 442, 443, 444, 445, 446, 447, and 448.

In aspects of the technology described herein, the reflected lightforming each dot can be analyzed to determine a TOF depth for the dot.As mentioned, the TOF depth is calculated by determining the elapsedtime taken for the projected light to reflect off an object in the sceneand be captured by the imaging sensor.

The TOF depth for each dot can then be used to match the dot in thecaptured image to a corresponding dot in the reference image orreference model. Once dots are identified within the captured image, adistance between the captured dot and the projected dot can bedetermined using a known offset between the light emitter in the imagesensor. The distance between these corresponding dots can be used aspart of a triangulation calculation to determine a structured lightdepth for the dot. In this way, each dot in the captured image can beassigned a structured light depth. Other implementations may not use TOFduring ranging operation and only use TOF range information duringcalibration.

Returning to FIG. 2, a dot detection component 135 analyzes the imagecaptured by the image system 120 to detect dots within the image. Asmentioned, the light is emitted in a pattern. An analysis is performedto determine which emitted units correspond to captured units in theimage. A first step in dot detection can be to isolate light byfrequency within the calibration image to focus the analysis on imagecontent within a frequency corresponding to the emitted light.

Even within the relevant light frequency, the image can include noiseand other content that are not dots. Units, described as dots herein,can be identified by obtaining a binary segmentation of the image suchthat each pixel is classified as (1) covering a dot or (2) not coveringa dot. A pixel covering a dot can also be referred to as a pixelassociated with a dot.

Determining whether a pixel is associated with a dot can also includedetermining an intensity profile based on the intensities for eachdetected dot. With regard to detecting the presence (or absence) of adot at a pixel, a variety of strategies can be available. One option canbe to perform thresholding based on a global threshold value. If thedetected intensity at a pixel is greater than the global thresholdvalue, then the pixel is considered to be associated with a dot. Anotheroption is to perform local or adaptive thresholding for featuredetection. Once the dots are isolated from noise in the reflected image,and therefore detected, the dots can be identified.

A dot identification component 140 attempts to identify a correspondencebetween detected dots in the image with projected dots. In an aspect,each unit in the projected image is assigned a unique identificationcorresponding to an identified unit in the projected image. As thecalibration image is taken from an image projected off a flat surface,the orientation and arrangements of dots in the projection should matchthose in the image.

A TOF-depth map calculation component 125 uses the frequency of thereceived light to calculate a TOF z-depth for each unit (e.g., dot)identified by the dot identification component 140.

A structured-light depth-map calculation component 130 uses the distancebetween the emitted light and a dot to determine the depth of an objectin the scene using triangulation, as explained in more detail elsewhere.

The calibration component 122 generates a new reference image, orconfirms the existing reference image is accurate, according to thetechnology described herein. In one aspect, a new reference image isgenerated from calibration images capturing two objects separated by adistance. In another aspect, the new reference image is generated fromcalibration images of a single flat surface, such as a wall.

Initially, a plurality of calibration images are captured. Thecalibration images capture both structured light and modulated light.The calibration images capture a three-dimensional scene comprising twoobjects at different ranges. The plurality of calibration images can becaptured with the sensor in a different location. The eventual newreference image can be calculated by averaging, or otherwise combining,analysis of the several calibration images.

For simplicity, the following discussion proceeds as if the imagingoptics were not subject to radial distortion, such as pincushion orbarrel distortion, however, distortion correction can be utilized inmany implementations. In some implementations, optics with minimalradial distortion are used, in other implementations the image may beexplicitly resampled/rectified to correct for radial distortion. Inanother implementation, the x and y image coordinates of each dot areconverted into a radial distortion corrected representation beforefurther operations are carried out on the x and y image location values.Any further reference to x or y dot location could be considered toapply to either distortion corrected or uncorrected values depending onthe implementation.

FIG. 7 shows a suitable calibration environment 700. The calibrationenvironment includes a range sensor 710 oriented towards a first box 720and a second box 730. The two boxes are separated by a distance 740,thereby presenting planar surfaces at two distances from the sensor 710.The two boxes present a substantially flat surface that is substantiallyorthogonal to an imaginary line of sight extending from the camera.Other sources of flat surfaces may be used instead of boxes. In oneinstance, a single box against a wall is used with the wall forming onesurface and the box side forming the other. In some implementations noflat surface is required, any surface can be used.

The calibration scene is illuminated by the pattern projector in thesensor 710 and an image, such as the calibration image 800 in FIG. 8, istaken. The calibration image 800 depicts an image of the illuminationreflected off the two box faces. The left half 820 of the calibrationimage 800 depicts the pattern reflected off a box face that is half ameter from the sensor 710. The right half 810 of the image 800 capturesa reflection of the projected image off a surface that is a meter fromthe sensor 710. Aspects of the technology are not limited to thesedistances. One meter and 0.5 meters are just example distances. Thedistances to the two surfaces can be calculated using TOF data for thecaptured images. Given that the disparity (i.e., horizontal movement ofthe illuminated light) introduced by distance from the camera to anobject is proportional to 1/distance, an estimate of the hypotheticalappearance of the projected image at infinity for a camera with nogeometric distortion can be estimated. The difference in appearancebetween the left pattern 822 and right pattern 812 is intended toillustrate an intensity difference in the pixels. Intensity of thepattern decreases with distance traveled. The intensity difference canbe adjusted, as described subsequently.

The image in FIG. 9 is an estimated reference image 900. The estimatedreference image is created by adjusting the captured illuminationpattern in the calibration image to a reference distance. The portion ofthe calibration image 800 showing the reflection 822 of the projectedpattern off the object at 0.5 meters has been shifted by 10 pixels tothe left forming the left portion 920 of the calculated referencepattern 922. The pixels are shifted to the left to compensate for thedisparity introduced by the illumination baseline, which is the distancebetween the projector and image sensor 710. The reflection 812 of theprojected pattern off the object at one meter is shifted by half this(due to 1/d), giving a 5 pixel shift to the left. This leaves a gap 924of five pixel's width between the left half 920 and right half 910 ofimage 900. The gap means that the entire reference image cannotnecessarily be reconstructed from a single image of the scene.

The pixel shift along the x axis can be calculated using:

X_ADJUSTED=X_DOT−c/Z_TOF

Where c is a constant that is typically a function of the baselinedistance between the illumination and the imaging sensor and the focallength of the lens. The above equation assumes that the imaging sensorand the light emitter are located in a side-by-side arrangement next toeach other along the x-axis. If the camera and emitter are arrangedalong the y-axis, then the disparity would be along the y-axis.

In an aspect, the image 900 is scaled to correct for1/distance{circumflex over ( )}2 illumination drop-off. As theillumination from the sensor 710 spreads out it becomes progressivelyweaker. Using the TOF range information, a z-distance for each pixelcontaining a light unit is calculated. This distance is used as ascaling factor and applied to each pixel in the reference image togenerate a corrected pixel intensity. The scaling factor is applied bymultiplying the pixel intensity by the TOF distance squared.

In one aspect, the final reference image model is an average of a numberof these estimated reference images. Each estimated reference image canbe calculated by moving the sensor 710 to a different location. Otherimplementations use a consistency metric, median, or other image/signalprocessing algorithms to combine the estimated reference images into areplacement reference image.

In one aspect, the replacement reference image is compared to theoriginal reference image. The original reference image may be replacedif the difference between the two images exceeds a threshold difference.

The calibration component 122 can also perform calibration using imagesof a single plane taken at different distances. In an aspect, thecalibration images are captured as a user moves the sensor towards andaway from a largely multi-path free surface, such as a wall. In oneaspect, the user puts the device in calibration mode. The device mayoutput calibration instructions for the user to follow. If the devicehas a graphical user interface, or is coupled to one, then instructionscan comprise an animation of a person moving the device towards and thenaway from a surface. The movement can be generally perpendicular to theviewing surface.

In one aspect, the reference model used directly by the algorithm is notan image at a particular known distance, it is a list of dot locationsin the image at a known distance. The projection pattern is assumed tobe composed of dots or some sort of markers. As the system is movedaround, the dots are tracked. When the correct baseline and geometricdistortion parameters are known, the dot locations in the referencemodel can be calculated. Each frame gives a new estimate of the dotlocations: these estimates can be combined so as to remove any residualerror. Also, some dots are only visible in certain frames, as with thegeneric image case.

The calibration method is described in more detail with reference FIGS.10 and 12. Initially, multiple calibration images taken at differentdistances can be combined and the units shown. FIG. 5A shows a portionof identified dots combined in a single image from multiple calibrationimages. Each string of dots, such as string 501A, represent a single dotidentified in multiple calibration images. The different dots move fromimage-to-image because images are taken at different depths.Interference and other abnormalities can prevent a dot from beingidentified in each frame or image.

Different corrections can be made in some aspects, for example, FIG. 5Bshows the same series of dots, except corrected for geometricdistortion. In some aspects, the correct geometric distortion needs tobe determined before corrections can be made.

Once corrections are made, the units can be depth corrected using TOFdata. This can also be described as normalization to a single depth. Inessence, the dots are relocated in the x-y plane according to thez-depth. In a theory, the dots should all have exactly the same x-ycoordinates. In reality, the dots will form a cluster with slightlydifferent coordinates, as is shown in FIG. 6. For example, cluster 601represents depth corrected dots taken at different distances. Theaverage x-y coordinate 602 can be used as the location for the dot inthe new reference image.

In some instances, the baseline or geometric distortion parameters aremisestimated or unknown. The dots are tracked across time to back out todetermine the baseline and the geometric distortion. For the correctbaseline and geometric distortion parameters, the estimates of the dotreference model for each frame should be very consistent (giving clearclusters of dot locations). If there are errors in the parameters, thenthe dot location is not consistent in the estimated reference model. Byexpressing a cost function for the denseness of the cluster of estimatesfor each dot in the reference model, the baseline and geometricdistortion parameters can be determined via optimization or a standardinverse problem algorithm. The cost function may be standard deviationof the location or mean absolute deviation. Additional details have beenpreviously described above.

FIG. 2 schematically represents an example of a structured light system100A suitable for determining a depth map from a structured light image.Structured light system 100A includes the same components of structuredlight system 100 described with reference to FIG. 1, except thatstructured light system 100A includes a separate TOF light source 115and a separate structured light source 112. The TOF light source 115emits modulated light suitable for TOF depth calculations. Thestructured light source 112 emits structured light that is notmodulated.

Turning now to FIG. 10, a method 1000 of calibrating a structured lightsensor is described, according to an aspect of the technology describedherein. Method 1000 can be performed by a structured light system, suchas system 100 described previously.

At step 1010, structured light is emitted towards a scene from a lightemitter. The structured light comprises a plurality of individualemitted units forming a structured arrangement. The structured light isalso modulated for making time-of-flight (TOF) depth calculations. Thelight emitted can be described as modulated-structured light. In thisdiscussion, a structured light image corresponds to an image derived inpart from use of a structured light source. A structured light sourcecorresponds to a light source or illumination source that projects aplurality of units (e.g., dots) arranged to form a pattern or structure.In some aspects, the light source for projecting a structured lightimage can be an infrared light source and/or another light source withreduced or minimized detectability in the visible spectrum. This canallow the structured light image to be projected onto an environmentwhile having a reduced or minimized impact on images obtained usingconventional visible light cameras (and/or other visible lightdetectors). The structured light image can then be captured using acorresponding camera (and/or other detector) suitable for detection ofthe type of light projected by the structured light source.

The units of the structured light image can correspond to any convenienttype of reference pattern, so long as the reference pattern at any pointin time is known at the time of calibration (such as predetermined). Invarious aspects, the number of units projected by a structured lightsource can be substantially smaller than the number of pixels used torepresent an environment. As a result, the number of pixels illuminatedby a dot, or other unit, from a structured light source can besubstantially less than the total number of pixels. This can be incontrast to the light images projected by typical time-of-flightsystems, where the projected illumination can correspond to continuousillumination or a “flood fill” that illuminates all or substantially allof the pixels in a view. For example, for a structured light image basedon illumination from a structured light source, the number of pixelsthat are (at least partially) illuminated by a dot can be 60% or less ofthe total number of pixels in the field of view corresponding to anenvironment, or 50% or less, or 25% or less, or 10% or less, or possiblyeven 1% or less. It is further noted that in aspects where the number ofdots projected in a structured light image is substantially less thanthe number of pixels in a corresponding field of view, the dotsprojected in the structured light image may have overlap with more thanone pixel.

In aspects, the technology described herein outputs both a structuredlight and modulated light through a single light emitter. In this way,the modulated light does not flood the field, but instead follows aratio consistent with a structured light system and each pixel may notreceive modulated light. In another aspect, the system uses separateemitters to output structured light and modulated light. Reflectionsfrom the two light sources can be captured by a single imaging sensor.When two different emitters are used, frequencies need to be coordinatedto differentiate the reflections from the two sources. Either way, thedepth determined by TOF from the reflected modulated light can be usedto assign a depth to each unit of the structured light received.

The emitter outputs structured light that is also modulated light. In anexample, the source of modulated light may be an incoherent lightsource, which emits transmitted light that is modulated with a signal ata modulation frequency. In an example, the light from the device may bemodulated rapidly, such that the amount of illumination changesperiodically. In a phase modulation system, the light emitter can outputlight at multiple modulation frequencies. The light emitter may beselected so that the wavelength of the emitted light is the mostappropriate wavelength for a particular application. In an aspect, thelight source may be selected to be a source of light of an appropriatewavelength for the application for which it is intended.

At step 1020, a plurality of calibration images of the structured lightreflected off the scene is captured through an image sensor. The imagescomprise a plurality of reflected units of structured light. The imagesensor can also capture a modulation or frequency of the reflected lightfor use in calculating a TOF depth. In one aspect, the plurality ofcalibration images are captured as a user moves the sensor towards andaway from a largely multi-path free surface, such as a wall.Accordingly, different calibrations images are captured at differentdepths.

At step 1030, a time-of-flight distance between the calibration surfaceand the image sensor is calculated for individual images within theplurality of calibration images using time-of-flight distancemeasurements. The light source illuminates the calibration surface andat least some of the light is reflected back toward the camera from thesurface. The reflected light may be detected by the image sensor. Thereflected light is also modulated and may be out of phase with thetransmitted light due to the delay caused by the distance the light hastravelled on the return trip between the sensor and the object. For eachpixel of the image sensor, the amplitude and phase difference of thereceived signal relative to the transmitted light may be determined andused to calculate a depth for the calibration surface. This process isrepeated for each calibration image.

At step 1040, the units in the structured light pattern are identified.Before a TOF z-depth is calculated for each unit, the units may first beidentified within the image. As mentioned, the light is emitted in apattern. A first step can be to isolate light by frequency to focus theanalysis on content within a frequency corresponding to the emittedlight. Even within the relevant light frequency, the image can includenoise and other content that are not dots. Units, described as dotsherein, can be identified by obtaining a binary segmentation of theimage such that each pixel is classified as (1) covering a dot or (2)not covering a dot. A pixel covering a dot can also be referred to as apixel associated with a dot. This can also include determining anintensity profile based on the intensities for each detected dot. Withregard to detecting the presence (or absence) of a dot at a pixel, avariety of strategies can be available. One option can be to performthresholding based on a global threshold value. If the detectedintensity at a pixel is greater than the global threshold value, thenthe pixel is considered to be associated with a dot. Once the dots areisolated from noise in the reflected image, and therefore detected, az-depth can be calculated.

At step 1050, the x-y coordinates of the units in each image aredetermined.

At step 1060, normalized images are generated by normalizing the x-ycoordinates of the units in each image to a virtual distance between thecalibration surface and the image sensor using the time-of-flightdistance between the sensor and the calibration surface for each image.The normalizing produces disparity corrected units. The normalizedimages depict what the structured light images would look like if allthe images were taken at the same distance from the calibration scene.

The TOF z-depth for each dot can be used to calculate an adjusted x-yvalue for each dot that effectively moves the dot to the position itwould appear at were the z-depth at infinity and allows for acorrespondence to the projected image to be made. For a single dot inthe reflected image having a coordinate X_DOT, Y_DOT, Z_DOT_TOF, theTOF-depth adjusted location (X_ADJUSTED, Y_ADJUSTED) can be calculatedas follows:

Y_ADJUSTED=Y_DOT(so this dimension doesn't change)

X_ADJUSTED=X_DOT−c/Z_DOT_TOF

Where c is a constant that is a function of the baseline distancebetween the illumination and the imaging sensor and the distance betweenthe imaging sensor and the imaging optics. The above equation assumesthat the imaging sensor and the light emitter are located in aside-by-side arrangement next to each other along the x-axis. However,aspects can work with a device that has the imaging sensor and the lightemitter in a top-to-bottom arrangement along the y-axis, in which casethe X_ADJUSTED=X_DOT and Y_ADJUSTED=Y_DOT−c/Z_DOT_TOF. In someimplementations, the illumination may have an arbitrary relationship tothe sensor, with some combination of x, y, and z baseline distance, notpurely in one axis. In an alternate implementation, the dot locationsmay be transformed to an arbitrary z-distance, not restricted toinfinity. This process can be repeated for each dot or unit detected,until each unit is repositioned to form the TOF-adjusted structuredlight image.

At step 1070, individual disparity corrected units taken from multipleimages form a plurality of unit clusters.

At step 1080, an average x-y coordinate for units in each cluster isdetermined. This average x-y coordinate becomes the new referencelocation for the unit represented by the cluster.

At step 1090, a new reference model is generated that consists of theaverage x-y coordinate for multiple clusters of disparity correctedunits. The new reference model can be used to calculate distances toobjects using the structured light reflection.

In one aspect, the reflected unit is mapped to a corresponding emittedunit using x-y coordinates within the image and the TOF z-depth for thereflected unit. Dot identification or mapping attempts to identify acorrespondence between detected dots in the image with projected dots.In an aspect, each unit in the projected image is assigned a uniqueidentification corresponding to an identified unit in the projectedimage. The TOF z-depth is used to assign a corresponding identity toeach observed dot in the image.

Turning now to FIG. 11, a method 1100 of calibrating a structured lightsensor is described, according to an aspect of the technology describedherein. Method 1100 can be performed by a structured light system, suchas system 100 described previously.

At step 1110, structured light is emitted towards a calibration scenefrom a structured light emitter. The structured light comprising aplurality of individual emitted units forming a structured arrangement.The calibration scene can comprise a wall, a group of objects, or someother environment.

At step 1120, modulated light is emitted towards the calibration scenefrom a modulated light emitter. The modulated light is modulated formaking time-of-flight (TOF) depth calculations.

At step 1130, a plurality of calibration images of the structured lightand the modulated light reflected off the calibration scene are capturedby an image sensor. The calibration images captured with the imagesensor at more than one distance from the calibration scene. The imagesensor can be moved to different distances by a user as part of thecalibration process. The image sensor can output a user interface thatprovides guidance to the user about where to place the image sensor.

At step 1140, a plurality of distances from the image sensor todifferent portions of the calibration scene are calculated using TOFdata derived from the modulated light reflected off the calibrationscene. Calculating distances using TOF data has been describedpreviously.

At step 1150, a disparity-corrected individual calibration image isgenerated by resampling the first portion according to the plurality ofdistances. The pixel shift along the x-axis can be calculated using:

X_ADJUSTED=X_DOT−c/Z_TOF

Where c is a constant that is a function of the baseline distancebetween the illumination and the imaging sensor and the distance betweenthe imaging sensor and the imaging optics. The above equation assumesthat the imaging sensor and the light emitter are located in aside-by-side arrangement next to each other along the x-axis. If thecamera and emitter are arranged along the y-axis, then the disparitywould be along the y-axis.

At step 1160, a new reference image is generated by combining multipledisparity corrected calibration images taken at multiple differentdistances from the calibration scene as the image sensor is movedaround. Combining multiple images corrects for gaps in coverage that maybe caused by the disparity correction.

In addition to the above, a geometric correction and light intensitycorrection may be performed. A calibration image can be scaled tocorrect for 1/distance{circumflex over ( )}2 illumination drop-off. Asthe illumination from the sensor spreads out as distance from the sensorincreases, the light becomes progressively weaker. Using the TOF rangeinformation, a z-distance for each pixel containing a light unit iscalculated. This distance is used as a scaling factor and applied toeach pixel in the reference image to generate a corrected pixelintensity. The scaling factor is applied by multiplying the pixelintensity by the TOF distance squared.

Turning now to FIG. 12, a method 1200 of calibrating a structured lightsensor is described, according to an aspect of the technology describedherein. Method 1200 can be performed by a structured light system, suchas system 100 described previously.

At step 1210, structured light is emitted towards a calibration scenefrom a structured light emitter. The structured light comprises aplurality of individual emitted units forming a structured arrangement.In this discussion, a structured light image corresponds to an imagederived in part from use of a structured light source. A structuredlight source corresponds to a light source or illumination source thatprojects a plurality of units (e.g., dots) arranged to form a pattern orstructure. In some aspects, the light source for projecting a structuredlight image can be an infrared light source and/or another light sourcewith reduced or minimized detectability in the visible spectrum. Thiscan allow the structured light image to be projected onto an environmentwhile having a reduced or minimized impact on images obtained usingconventional visible light cameras (and/or other visible lightdetectors). The structured light image can then be captured using acorresponding camera (and/or other detector) suitable for detection ofthe type of light projected by the structured light source.

The units of the structured light image can correspond to any convenienttype of reference pattern, so long as the reference pattern at any pointin time is known at the time of calibration (such as predetermined). Invarious aspects, the number of units projected by a structured lightsource can be substantially smaller than the number of pixels used torepresent an environment. As a result, the number of pixels illuminatedby a dot, or other unit, from a structured light source can besubstantially less than the total number of pixels.

At step 1220, modulated light is emitted towards the calibration scenefrom a modulated light emitter. The modulated light is modulated formaking time-of-flight (TOF) depth calculations. In an example, thesource of modulated light may be an incoherent light source, which emitstransmitted light that is modulated with a signal at a modulationfrequency. In an example, the light from the device may be modulatedrapidly, such that the amount of illumination changes periodically. In aphase modulation system, the light emitter can output light at multiplemodulation frequencies. The light emitter may be selected so that thewavelength of the emitted light is the most appropriate wavelength for aparticular application. In an aspect, the light source may be selectedto be a source of light of an appropriate wavelength for the applicationfor which it is intended.

At step 1230, a plurality of calibration images of the structured lightand the modulated light reflected off the calibration scene is capturedthrough an image sensor. The images comprise a plurality of reflectedunits of structured light. The system uses separate emitters to outputstructured light and modulated light. Reflections from the two lightsources can be captured by a single imaging sensor. When two differentemitters are used, frequencies need to be coordinated to differentiatethe reflections from the two sources. The calibration images can betaken at different distances from the calibration scene as the usermoves the sensor different distances from the calibration scene. Thecalibration scene can comprise a flat surface, such as a wall.

At step 1240, a TOF z-depth for the calibration scene for the pluralityof calibration images is calculated using the modulation of thereflected modulated light detected at the image sensor. The light sourcemay illuminate an object within the field of the camera and at leastsome of the light is reflected back toward the camera from the object.The reflected light may be detected by the image sensor. The reflectedlight is also modulated and the reflected light may be out of phase withthe transmitted light due to the delay caused by the distance the lighthas travelled on the return trip between the sensor and the calibrationscene. For each pixel of the image sensor, the amplitude and phasedifference of the received signal relative to the transmitted light maybe determined for each modulation frequency and used to calculate adepth for the image.

At step 1250, the plurality of calibration images are normalized to avirtual distance between the calibration scene and the image sensor, thenormalization using the TOF distance between the sensor and thecalibration scene for each image. The normalized calibration imagescomprising disparity corrected units. The TOF z-depth for each dot canbe used to calculate an adjusted x-y value for each dot that effectivelymoves the dot to the position it would appear at were the z-depth atinfinity and allows for a correspondence to the projected image to bemade. For a single dot in the reflected image having a coordinate X_DOT,Y_DOT, Z_DOT_TOF, the TOF-depth adjusted location (X_ADJUSTED,Y_ADJUSTED) can be calculated as follows:

Y_ADJUSTED=Y_DOT(so this dimension doesn't change)

X_ADJUSTED=X_DOT−c/Z_DOT_TOF

Where c is a constant that is a function of the baseline distancebetween the illumination and the imaging sensor and the distance betweenthe imaging sensor and the imaging optics. The above equation assumesthat the imaging sensor and the light emitter are located in aside-by-side arrangement next to each other along the x-axis. However,aspects can work with a device that has the imaging sensor and the lightemitter in a top-to-bottom arrangement along the y-axis, in which casethe X_ADJUSTED=X_DOT and Y_ADJUSTED=Y_DOT−c/Z_DOT_TOF. In someimplementations, the illumination may have an arbitrary relationship tothe sensor, with some combination of x, y, and z baseline distance, notpurely in one axis. In an alternate implementation, the dot locationsmay be transformed to an arbitrary z-distance, not restricted toinfinity. This process can be repeated for each dot or unit detected,until each unit is repositioned to form the TOF-adjusted structuredlight image.

At step 1260, individual disparity corrected units across multiplecalibration images are tracked to form a plurality of unit clusters.

At step 1270, an average x-y coordinate for disparity corrected units ineach cluster is calculated.

At step 1280, a new reference model that consists of the average x-ycoordinate for each clusters of disparity corrected units is generated.

Exemplary Operating Environment

Referring to the drawings in general, and initially to FIG. 13 inparticular, an exemplary operating environment for implementing aspectsof the technology described herein is shown and designated generally ascomputing device 1300. Computing device 1300 is but one example of asuitable computing environment and is not intended to suggest anylimitation as to the scope of use of the technology described herein.Neither should the computing device 1300 be interpreted as having anydependency or requirement relating to any one or combination ofcomponents illustrated.

The technology described herein may be described in the general contextof computer code or machine-useable instructions, includingcomputer-executable instructions such as program components, beingexecuted by a computer or other machine, such as a personal dataassistant or other handheld device. Generally, program components,including routines, programs, objects, components, data structures, andthe like, refer to code that performs particular tasks or implementsparticular abstract data types. The technology described herein may bepracticed in a variety of system configurations, including handhelddevices, consumer electronics, general-purpose computers, specialtycomputing devices, etc. Aspects of the technology described herein mayalso be practiced in distributed computing environments where tasks areperformed by remote-processing devices that are linked through acommunications network.

With continued reference to FIG. 13, computing device 1300 includes abus 1310 that directly or indirectly couples the following devices:memory 1312, one or more processors 1314, one or more presentationcomponents 1316, input/output (I/O) ports 1318, I/O components 1320, andan illustrative power supply 1322. Bus 1310 represents what may be oneor more busses (such as an address bus, data bus, or a combinationthereof). Although the various blocks of FIG. 13 are shown with linesfor the sake of clarity, in reality, delineating various components isnot so clear, and metaphorically, the lines would more accurately begrey and fuzzy. For example, one may consider a presentation componentsuch as a display device to be an I/O component. Also, processors havememory. The inventors hereof recognize that such is the nature of theart and reiterate that the diagram of FIG. 13 is merely illustrative ofan exemplary computing device that can be used in connection with one ormore aspects of the technology described herein. Distinction is not madebetween such categories as “workstation,” “server,” “laptop,” “handhelddevice,” etc., as all are contemplated within the scope of FIG. 13 andrefer to “computer” or “computing device.”

Computing device 1300 typically includes a variety of computer-readablemedia. Computer-readable media can be any available media that can beaccessed by computing device 1300 and includes both volatile andnonvolatile, removable and non-removable media. By way of example, andnot limitation, computer-readable media may comprise computer storagemedia and communication media. Computer storage media includes bothvolatile and nonvolatile, removable and non-removable media implementedin any method or technology for storage of information such ascomputer-readable instructions, data structures, program modules, orother data.

Computer storage media includes RAM, ROM, EEPROM, flash memory or othermemory technology, CD-ROM, digital versatile disks (DVD) or otheroptical disk storage, magnetic cassettes, magnetic tape, magnetic diskstorage or other magnetic storage devices. Computer storage media doesnot comprise a propagated data signal.

Communication media typically embodies computer-readable instructions,data structures, program modules, or other data in a modulated datasignal such as a carrier wave or other transport mechanism and includesany information delivery media. The term “modulated data signal” means asignal that has one or more of its characteristics set or changed insuch a manner as to encode information in the signal. By way of example,and not limitation, communication media includes wired media such as awired network or direct-wired connection, and wireless media such asacoustic, RF, infrared, and other wireless media. Combinations of any ofthe above should also be included within the scope of computer-readablemedia.

Memory 1312 includes computer storage media in the form of volatileand/or nonvolatile memory. The memory 1312 may be removable,non-removable, or a combination thereof. Exemplary memory includessolid-state memory, hard drives, optical-disc drives, etc. Computingdevice 1300 includes one or more processors 1314 that read data fromvarious entities such as bus 1310, memory 1312, or I/O components 1320.Presentation component(s) 1316 present data indications to a user orother device. Exemplary presentation components 1316 include a displaydevice, speaker, printing component, vibrating component, etc. I/O ports1318 allow computing device 1300 to be logically coupled to otherdevices, including I/O components 1320, some of which may be built in.

Illustrative I/O components include a microphone, joystick, game pad,satellite dish, scanner, printer, display device, wireless device, acontroller (such as a stylus, a keyboard, and a mouse), a natural userinterface (NUI), and the like. In aspects, a pen digitizer (not shown)and accompanying input instrument (also not shown but which may include,by way of example only, a pen or a stylus) are provided in order todigitally capture freehand user input. The connection between the pendigitizer and processor(s) 1314 may be direct or via a couplingutilizing a serial port, parallel port, and/or other interface and/orsystem bus known in the art. Furthermore, the digitizer input componentmay be a component separated from an output component such as a displaydevice, or in some aspects, the useable input area of a digitizer maycoexist with the display area of a display device, be integrated withthe display device, or may exist as a separate device overlaying orotherwise appended to a display device. Any and all such variations, andany combination thereof, are contemplated to be within the scope ofaspects of the technology described herein.

An NUI processes air gestures, voice, or other physiological inputsgenerated by a user. Appropriate NUI inputs may be interpreted as inkstrokes for presentation in association with the computing device 1300.These requests may be transmitted to the appropriate network element forfurther processing. An NUI implements any combination of speechrecognition, touch and stylus recognition, facial recognition, biometricrecognition, gesture recognition both on screen and adjacent to thescreen, air gestures, head and eye tracking, and touch recognitionassociated with displays on the computing device 1300. The computingdevice 1300 may be equipped with camera systems 1326. The camera system1326 can include depth cameras, such as stereoscopic camera systems,infrared camera systems, RGB camera systems, structured light camerasystems, TOF camera systems, and combinations of these, for generatingdepth images. The depth images can be used in gesture detection andrecognition, displayed to a user, or used to generate augmented reality,virtual reality, or other imagery. Additionally, the computing device1300 may be equipped with accelerometers or gyroscopes that enabledetection of motion. The output of the accelerometers or gyroscopes maybe provided to the display of the computing device 1300 to renderimmersive augmented reality or virtual reality.

A computing device may include a radio 1324. The radio 1324 transmitsand receives radio communications. The computing device may be awireless terminal adapted to receive communications and media overvarious wireless networks. Computing device 1300 may communicate viawireless protocols, such as code division multiple access (“CDMA”),global system for mobiles (“GSM”), or time division multiple access(“TDMA”), as well as others, to communicate with other devices. Theradio communications may be a short-range connection, a long-rangeconnection, or a combination of both a short-range and a long-rangewireless telecommunications connection. When we refer to “short” and“long” types of connections, we do not mean to refer to the spatialrelation between two devices. Instead, we are generally referring toshort range and long range as different categories, or types, ofconnections (i.e., a primary connection and a secondary connection). Ashort-range connection may include a Wi-Fi® connection to a device(e.g., mobile hotspot) that provides access to a wireless communicationsnetwork, such as a WLAN connection using the 802.11 protocol. ABluetooth connection to another computing device is a second example ofa short-range connection. A long-range connection may include aconnection using one or more of CDMA, GPRS, GSM, TDMA, and 802.16protocols.

The computing device 1300 can take the form of an augmented realitydevice. One potential application for the depth image produced by thetechnology described herein can be for determining a mesh representationof an environment for an augmented reality device. An augmented realitydevice can support the presentation of augmented reality (and/ormixed-reality) images. Augmented reality images include augmentedreality objects, which are virtualized objects or entities (e.g.,holographic content or mixed-reality content), that are rendered for auser associated with the augmented reality device. In some aspects, freespace input detected by an augmented reality device can also be used tocontrol the device and/or interact with the environment. For example,one or more objects in an augmented reality image can be rendered basedon a real world environment, where the real world environment can becaptured in a digital representation by the augmented reality device.Understanding the real world environment can be based on severaldifferent techniques that provide the augmented reality device withinformation about the environment. This can include scanning anenvironment in real time and generating a mesh representation of theenvironment to provide the augmented reality device with informationabout the environment. Augmented reality devices can includehead-mounted devices.

If a depth map of the environment is available, the mesh representationcan also be used to display an augmented reality image to a user thatappears to incorporate the scanned environment. This can allow, forexample, a user to navigate through a real world environment based onaugmented reality objects and/or to view augmented reality objects incombination with the real world environment. Additionally oralternatively, this can allow an augmented reality device to detect usermovements in the environment in order to convert the user movements intoinputs for controlling the augmented reality device (e.g., gesturedetection).

The technology described herein has been described in relation toparticular aspects, which are intended in all respects to beillustrative rather than restrictive. While the technology describedherein is susceptible to various modifications and alternativeconstructions, certain illustrated aspects thereof are shown in thedrawings and have been described above in detail. It should beunderstood, however, that there is no intention to limit the technologydescribed herein to the specific forms disclosed, but on the contrary,the intention is to cover all modifications, alternative constructions,and equivalents falling within the spirit and scope of the technologydescribed herein.

1. A method of calibrating a structured light sensor, comprising:emitting structured light towards a calibration surface from a lightemitter, the structured light comprising a plurality of individualemitted units forming a structured arrangement, the structured lightalso being modulated for making time-of-flight (TOF) depth calculations;capturing, through an image sensor, a plurality of calibration images ofthe structured light reflected off the calibration surface, thecalibration images comprising a plurality of reflected units of thestructured light; calculating a time-of-flight distance between thecalibration surface and the image sensor for individual images withinthe plurality of calibration images using time-of-flight distancemeasurements; determining x-y coordinates for a plurality of reflectedunits in the calibration images; generating normalized calibrationimages by normalizing the x-y coordinates of the reflected units in eachimage to a virtual distance between the calibration surface and theimage sensor using the TOF distance between the image sensor and thecalibration surface for each image, the normalizing producing aplurality of disparity corrected units; and generating a new referencemodel from the plurality of disparity corrected units.
 2. The method ofclaim 1, further comprising tracking individual disparity correctedunits from the plurality of disparity corrected units across multipleimages of the calibration images to form a plurality of unit clusters.3. The method of claim 2, further comprising calculating an average x-ycoordinate for units in each cluster within the plurality of unitclusters.
 4. The method of claim 1, further comprising calculating anupdated baseline distance between the image sensor and the light emitterusing time-of-flight distance calculations for the plurality ofreflected units identified in the multiple images of the calibrationimages taken at different distances.
 5. The method of claim 1, furthercomprising mapping the plurality of reflected units in several of thecalibration images to a corresponding emitted unit using x-y coordinateswithin an individual image of the calibration images.
 6. The method ofclaim 1, further comprising outputting a calibration instruction thatprompts a user to move the image sensor towards and away from thecalibration surface.
 7. The method of claim 1, wherein emittedstructured light is in the infrared spectrum.
 8. A method of calibratinga structured light sensor, comprising: emitting structured light towardsa calibration scene from a structured light emitter, the structuredlight comprising a plurality of individual emitted units forming astructured arrangement; emitting modulated light towards the calibrationscene from a modulated light emitter, the modulated light beingmodulated for making time-of-flight (TOF) depth calculations; capturing,through an image sensor, a plurality of calibration images of thestructured light and the modulated light reflected off the calibrationscene, the calibration images captured with the image sensor at morethan one actual distance from the calibration scene; and generating anew reference image from the plurality of calibration images.
 9. Themethod of claim 8, further comprising outputting a calibrationinstruction that prompts a user to move the image sensor towards andaway from the calibration scene.
 10. The method of claim 8, wherein thecalibration scene comprises a first surface and a second surface thatare substantially parallel to each other, the first surface separatedfrom the second surface by a distance measured orthogonally to the firstsurface and the second surface.
 11. The method of claim 8, furthercomprising contrast correcting the calibration images for estimatedobject reflectivity.
 12. The method of claim 8, further comprisingcorrecting the calibration images for illumination intensity drop-offusing a TOF z-depth for each calibration image.
 13. The method of claim8, wherein the structured light and the modulated light are emittedthrough a single emitter.
 14. The method of claim 8, further comprising,for an individual calibration image, calculating a plurality of measureddistances from the image sensor to different portions of the calibrationscene using TOF data derived from the modulated light reflected off thecalibration scene.
 15. The method of claim 14, generating adisparity-corrected individual calibration image by resampling theportions of the individual calibration image according to the pluralityof measured distances.
 16. A method of calibrating a structured lightsensor, comprising: emitting structured light towards a calibrationscene from a structured light emitter, the structured light comprising aplurality of individual emitted units forming a structured arrangement;emitting modulated light towards the calibration scene from a modulatedlight emitter, the modulated light being modulated for makingtime-of-flight (TOF) depth calculations; capturing, through an imagesensor, a plurality of calibration images of the structured light andthe modulated light reflected off the calibration scene, the calibrationimages captured with the image sensor at more than one depth from thecalibration scene; calculating a TOF z-depth for the plurality ofcalibration images using a modulation of the modulated light detected atthe image sensor; generating normalized calibration images bynormalizing the plurality of calibration images to a virtual distancebetween the calibration scene and the image sensor, the normalizingperformed using the TOF z-depth between the image sensor and thecalibration scene for each image, the normalized calibration imagescomprising disparity corrected units; and generating a new referencemodel from the normalized calibration images.
 17. The method of claim16, further comprising calculating an updated baseline distance betweenthe image sensor and the structured light emitter using time-of-flightdistance calculations for individual units identified in multiple imagestaken at different distances.
 18. The method of claim 16, furthercomprising outputting a calibration instruction that prompts a user tomove the image sensor towards and away from the calibration scene. 19.The method of claim 16, further comprising tracking individual disparitycorrected units across multiple normalized calibration images from thenormalized calibration images to form a plurality of disparity correctedunit clusters; and calculating an average x-y coordinate for thedisparity corrected units in each disparity corrected unit cluster. 20.The method of claim 16, wherein the method further comprises calculatinggeometric distortion parameters of a lens of the image sensor bytracking the individual emitted unit locations over multiple framescombined with TOF z-depth information.